1. Aberration Corrected STEM Microscopy 

Dr. Jaap Brink
JEOL USA, Inc.

1. Advances and Challenges in Electron Tomography

Dr. Paulo Ferreira
The University of Texas at Austin

1. In-situ TEM: Basics and Equipment Requirements
2. In-situ TEM: Applications (heating, deformation, gas reactions, wet-cell)

Dr. Alfredo Gomez
Universidad Nacional Autonoma de Mexico, Mexico

1. Simulation of images and diffraction patterns for HRTEM and STEM using the multislice method

Dr. Kazuo Ishizuka
HREM Research Inc. Japan

1. Exit wave reconstruction - software Cs correction
2. Data processing in Electron Microscopy - Deconvolution and
Strain analysis.

Dr. Sergio Mejia
Universidad Autónoma de Nuevo Leon, Mexico

1. Computation methods for HREM and STEM

1. HRTEM of defects and interfaces in solids.
2. Electron holography in the TEM: Measuring charges and fields with sub-nanometer resolution.
3. Cathodoluminescence studies:  combined imaging, spectroscopy, and time-resolved spectroscopy, with high spatial resolution.

Dr. Jose Reyes
Instituto de Fisica - Universidad Nacional Autonoma de Mexico

1. Electron diffraction characterization of materials

1. Low temperature scanning tunneling microscopy and spectroscopy of quantum engineered metallic thin films

1. Molecular Imaging of Carcinogenesis with Plasmonic Nanosensors

1. In-situ mechanical and electrical measurements in TEM
2. Polar surface induced growth of novel oxide nanostructures
3. Nanogenerators and nanopiezotronics